The 17th IEEE International Symposium on Software Reliability Engineering (ISSRE 2006)

7-10 November 2006 - Raleigh, North Carolina, USA



Industry

  1. Reliability of Store Integrator for Retail Store System
    Shirley Chao
  2. Improved quality and reduced product cycle time through defect prevention activity and analysis [Presentation]
    Eileen Francis and Cormac Cummins
  3. FCS readiness Analysis using Defect Detection Rate (DDR) [Presentation]
    David Rich and Rick Follenweider
  4. "How to reduce your test process with 30%" The application of operational Profiles at Philips Medical Systems [Presentation]
    Herman Hartmann and Jarmila Bokkerink
  5. Characterizing Software Defect Repair Times [Presentation]
    Robert Mullen
  6. Design for Testability Put into Practice [Presentation]
    Mauro Arcese
  7. An Improved Automated Testing Framework
    Guiying Jin, Yingbiao Zhou, Xuyang Tan, Chunlin Gong and Yexin Wang
  8. Performance-Oriented System Test in High Performance Computing Clusters [Presentation]
    Bin Ye
  9. Experiences with Profile-Based Testing (PBT) in a world of differences [Presentation]
    Mechelle Gittens, David Godwin, Enzo Cialini and Anthony Di Loreto
  10. The impact of inspection effectiveness on project management
    George Stark and Hema Srikanth
  11. Improving Software Reliability with Use Cases Done Right
    Kay Johnson and Theresa Kratschmer
  12. An Automatic Unit Testing Framework [Presentation]
    J. Jenny Li
  13. Estimating the Risk of Releasing Software [Presentation]
    Murphy Brendan
  14. Empirical testing of Open Source Operating System Reliability [Presentation]
    Anandeep Pannu and Hank Janssen
  15. XP and Robust Products
    Supratim Dasgupta
  16. Improving Test Effectiveness by Analyzing Customer Usage
    Hema Srikanth, Theresa Kratschmer and Randy Adair
  17. Using Stochastic Models in the Testing Process [Presentation]
    Robert Musson
  18. Applying Software Risk Models [Presentation]
    David Catlett